SUB-MICROMETER RESOLUTION TRANSVERSE ELECTRON BEAM SIZE MEASUREMENT SYSTEM BASED ON OPTICAL TRANSITION RADIATION

Stewart Boogert; Alexander Aryshev; Nobuhiro Terunuma; Junji Urakawa; Pavel Karataev; David Howell

SUB-MICROMETER RESOLUTION TRANSVERSE ELECTRON BEAM SIZE MEASUREMENT SYSTEM BASED ON OPTICAL TRANSITION RADIATION

Stewart Boogert, Alexander Aryshev, Nobuhiro Terunuma, Junji Urakawa, Pavel Karataev, David Howell

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution

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Abstract

Optical Transition Radiation (OTR) appearing when a charged particle crosses a boundary between two media with different dielectric properties has widely been used as a tool for transverse profile measurements of charged particle beams in numerous facilities worldwide. The resolution of the conventional monitors is defined by so-called Point Spread Function (PSF) dimension - the source distribution generated by a single electron and projected by an optical system onto a screen. In our experiment we managed to create a system which can practically measure the PSF distribution. We demonstrated that it is non-uniform. In this paper we represent the development of a novel sub-micrometer electron beam profile monitor based on the measurements of the PSF structure which visibility is sensitive to micrometer electron beam dimensions. In this report the recent experimental results and the future plans on the optimization of the monitor are presented.

Original language	English
Title of host publication	Proceedings of IPAC'10, Kyoto, Japan
Publication status	Published - 2010

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Cite this

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title = "SUB-MICROMETER RESOLUTION TRANSVERSE ELECTRON BEAM SIZE MEASUREMENT SYSTEM BASED ON OPTICAL TRANSITION RADIATION",

abstract = "Optical Transition Radiation (OTR) appearing when a charged particle crosses a boundary between two media with different dielectric properties has widely been used as a tool for transverse profile measurements of charged particle beams in numerous facilities worldwide. The resolution of the conventional monitors is defined by so-called Point Spread Function (PSF) dimension - the source distribution generated by a single electron and projected by an optical system onto a screen. In our experiment we managed to create a system which can practically measure the PSF distribution. We demonstrated that it is non-uniform. In this paper we represent the development of a novel sub-micrometer electron beam profile monitor based on the measurements of the PSF structure which visibility is sensitive to micrometer electron beam dimensions. In this report the recent experimental results and the future plans on the optimization of the monitor are presented.",

author = "Stewart Boogert and Alexander Aryshev and Nobuhiro Terunuma and Junji Urakawa and Pavel Karataev and David Howell",

year = "2010",

language = "English",

booktitle = "Proceedings of IPAC'10, Kyoto, Japan",

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T1 - SUB-MICROMETER RESOLUTION TRANSVERSE ELECTRON BEAM SIZE MEASUREMENT SYSTEM BASED ON OPTICAL TRANSITION RADIATION

AU - Boogert, Stewart

AU - Aryshev, Alexander

AU - Terunuma, Nobuhiro

AU - Urakawa, Junji

AU - Karataev, Pavel

AU - Howell, David

PY - 2010

Y1 - 2010

N2 - Optical Transition Radiation (OTR) appearing when a charged particle crosses a boundary between two media with different dielectric properties has widely been used as a tool for transverse profile measurements of charged particle beams in numerous facilities worldwide. The resolution of the conventional monitors is defined by so-called Point Spread Function (PSF) dimension - the source distribution generated by a single electron and projected by an optical system onto a screen. In our experiment we managed to create a system which can practically measure the PSF distribution. We demonstrated that it is non-uniform. In this paper we represent the development of a novel sub-micrometer electron beam profile monitor based on the measurements of the PSF structure which visibility is sensitive to micrometer electron beam dimensions. In this report the recent experimental results and the future plans on the optimization of the monitor are presented.

AB - Optical Transition Radiation (OTR) appearing when a charged particle crosses a boundary between two media with different dielectric properties has widely been used as a tool for transverse profile measurements of charged particle beams in numerous facilities worldwide. The resolution of the conventional monitors is defined by so-called Point Spread Function (PSF) dimension - the source distribution generated by a single electron and projected by an optical system onto a screen. In our experiment we managed to create a system which can practically measure the PSF distribution. We demonstrated that it is non-uniform. In this paper we represent the development of a novel sub-micrometer electron beam profile monitor based on the measurements of the PSF structure which visibility is sensitive to micrometer electron beam dimensions. In this report the recent experimental results and the future plans on the optimization of the monitor are presented.

M3 - Conference contribution

BT - Proceedings of IPAC'10, Kyoto, Japan

ER -